Mass spectrometer
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Mass spectrometer
MODEL RELEASED. Mass spectrometer. Researcher observing a time of flight secondary ion mass spectrometer (TOF SIMS). The TOF SIMS is used to analyse the surface of a sample. The sensor array can be seen through the round window (lower left). A pulsed ion beam is used to remove molecules from the subjects surface. The molecules are ionised and accelerated towards a detector. The time it takes them to reach the detector depends on their mass. The advantage of this system is that macromolecules (such as polymers or proteins) are not disintegrated by the beam. TOF SIMS is used in coatings research, microelectronics and surface contamination studies
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Media ID 6467417
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Analysing Analysis Apparatus Mass Spectrometer Port Hole Surface Window
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